The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Sep. 09, 2019
Applicant:
Siemens Medical Solutions Usa, Inc., Malvern, PA (US);
Inventors:
Alexander Hans Vija, Evanston, IL (US);
Michal Cachovan, Baiersdorf, DE;
Assignee:
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06N 20/00 (2019.01); G06T 2207/10108 (2013.01);
Abstract
For denoising in SPECT, such as qSPECT, machine learning is used to relate settings to noise structure. Given the SPECT imaging arrangement for a patient, the machine-learned model estimates the structure of the noise. This noise structure may be used to denoise the reconstructed representation.
Vija, Alexander. (2022). Deep learning-based denoising in quantitative single photon emission computed tomography (U.S. Patent No. 11250545). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11250545
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile