The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Jul. 19, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rafal P. Konik, Oronoco, MN (US);

Roger A. Mittelstadt, Byron, MN (US);

Brian R. Muras, Otsego, MN (US);

Chad A. Olstad, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24554 (2019.01);
Abstract

A structured query language (SQL) query is configured to present a selected portion of a result set to a user interface. The selected portion of the result set can be based on an offset criteria appended to the SQL query. The offset criteria determines a location of a first presented instance of the selected portion of the result set. The offset criteria is configured to determine the location of the first presented instance of the selected portion of the result set independent of a number of instances appearing between a first instance of the result set and the first presented instance of the selected portion of the result set.


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