The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Jun. 11, 2018
International Business Machines Corporation, Armonk, NY (US);
Daniel Dean, Yorktown Heights, NY (US);
Checed A. Rodgers, Bellevue, WA (US);
Dingcheng Li, Sunnyvale, CA (US);
Pei Ni Liu, Beijing, CN;
Xiao Xi Liu, Beijing, CN;
Hui Lei, Scarsdale, NY (US);
Yu Gu, Cedar Park, TX (US);
Jing Min Xu, Beijing, CN;
Yaoping Ruan, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments generally relate transforming data for a target schema. In some embodiments, a method includes receiving input data, where the input data includes a plurality of segments, and where the segments include a plurality of source fields containing target data. The method further includes characterizing the input data based at least in part on a plurality of predetermined metrics, where the predetermined metrics determine a structure of the input data. The method further includes mapping the target data in the source fields of the segments to a plurality of target fields of a target schema based at least in part on the characterizing. The method further includes populating the target fields of the target schema with the target data from the source fields based at least in part on the mapping.