The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Sep. 28, 2020
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Alexandre Campos Perez, San Mateo, CA (US);

Eric A. Bier, Palo Alto, CA (US);

Johan de Kleer, Los Altos, CA (US);

Ron Z. Stern, Palo Alto, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/362 (2013.01);
Abstract

One embodiment provides a system and method for identifying invariants in a software system. During operation, the system executes a test suite comprising a plurality of tests associated with the software system to output a list of likely invariants in the software system, and performs a test-generation operation attempting to generate counterexample tests for the likely invariants. In response to a counterexample test being successfully generated for a first likely invariant, the system removes the first likely invariant from the list of likely invariants and adds the successfully generated counterexample test to the test suite.


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