The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Apr. 29, 2020
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Mayukh Dutta, Bangalore Karnataka, IN;

Manoj Srivatsav, Bangalore Karnataka, IN;

Soumen Shekhar Das, Bangalore Karnataka, IN;

Gautham Parameshwar Hegde, Bangalore Karnataka, IN;

Sivasakthi Thirugnanapandi, Bangalore Karnataka, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 9/50 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0631 (2013.01); G06F 3/0604 (2013.01); G06F 3/067 (2013.01); G06F 3/0653 (2013.01); G06F 3/0683 (2013.01); G06F 9/5011 (2013.01); G06K 9/6256 (2013.01);
Abstract

In some examples, a system aggregates operational metric data of a plurality of storage volumes into aggregated operational metric data groups that correspond to different workload types of workloads for accessing data of a storage system. The system computes an operational metric for a first workload type of the different workload types, the operational metric relating to a resource of the storage system, where the computing of the operational metric for the first workload type comprises inputting aggregated operational metric data of a first aggregated operational metric data group of the aggregated operational metric data groups into a model trained at a system level of the storage system.


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