The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Apr. 12, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Dapeng Li, Yamanashi, JP;

Toshinori Matsukawa, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/00 (2006.01); G05B 19/4099 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); G06T 7/0008 (2013.01); G05B 2219/35134 (2013.01); G05B 2219/37558 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A control system includes a controller that controls machining of a workpiece, and a photographing device that photographs an image of the workpiece under machining operation. The controller generates a three-dimensional model of the workpiece under machining operation based on the acquired image, compares the generated three-dimensional model and a three-dimensional model generated by a machining simulation with each other, and determines a presence or absence of a machining defect based on a result of the comparison. When the machining defect is present and re-machining is possible, a setting is modified depending on a cause of the machining defect and additional machining is executed based on the modified setting.


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