The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Feb. 23, 2021
Applicant:

Elbit Systems Ltd., Haifa, IL;

Inventors:

Omer Hasharoni, Haifa, IL;

Itamar Nocham, Haifa, IL;

Assignee:

Elbit Systems Ltd., Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0093 (2013.01); G02B 27/0172 (2013.01); G02B 2027/014 (2013.01); G02B 2027/0138 (2013.01); G02B 2027/0187 (2013.01);
Abstract

A method and a system for displaying conformal synthetic data on a scene over a head-mounted see-through display (HMSTD) having a line of sight (LOS) are provided herein. The system may include: a tracker configured to track the LOS of the HMSTD; a display controller configured to display on the HMSTD a first display area comprising a synthetic image data conformal to a scene viewed from the HMSTD; wherein said display controller is configured to receive a desired point being a point within the scene which intersects the LOS of the HMSTD and to display a second display area on said HMSTD, wherein the second display area is positioned relative to said desired point, wherein said synthetic image data is displayed over the HMSTD at a reduced intensity on an overlap area between the first and the second areas.


Find Patent Forward Citations

Loading…