The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
May. 05, 2020
Canon Medical Systems Corporation, Otawara, JP;
Wenyuan Qi, Vernon Hills, IL (US);
Yi Qiang, Vernon Hills, IL (US);
Evren Asma, Vernon Hills, IL (US);
Xiaoli Li, Vernon Hills, IL (US);
Li Yang, Vernon Hills, IL (US);
Peng Peng, Vernon Hills, IL (US);
Jeffrey Kolthammer, Vernon Hills, IL (US);
CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;
Abstract
A method of normalizing detector elements in an imaging system is described herein. The method includes a line source that is easier to handle for a user, and decouples the normalization of the detector elements into a transaxial domain and an axial domain in order to isolate errors due to positioning of the line source. Additional simulations are performed to augment the real scanner normalization. A simulation of a simulated line source closely matching the real line source can be performed to isolate errors due to physical properties of the crystals and position of the crystals in the system, wherein the simulated detector crystals are otherwise modeled uniformly. A simulation of a simulated cylinder source can be performed to determine errors due to other effects stemming from gaps between the detector crystals.