The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Sep. 10, 2020
Applicant:

Iray Technology Company Limited, Shanghai, CN;

Inventors:

Zhongshou Huang, Shanghai, CN;

Tieer Gu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/20 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/241 (2013.01); G01T 1/2018 (2013.01); A61B 6/486 (2013.01);
Abstract

Embodiments of the present invention provide a radiation image detector and a manufacture method to produce the radiation image detector. The radiation image detector includes: a radiation conversion layer, configured to convert a radiation image into a visible light image; an image sensing layer for visible light, including a pixel array formed by a plurality of photosensitive pixels, configured to detect the visible light image; and a microlens layer, disposed between the radiation conversion layer and the image sensing layer, the microlens layer including a lens array formed by multiple micro convex lenses, and optical axes of the micro convex lenses being perpendicular to the image sensing layer. In addition, both the radiation conversion layer and the microlens layer have curved surface structures that are bended in the same direction that non-parallel radiations, emitted from an X-ray generator, will impinge perpendicularly on the radiation conversion layer.


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