The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Jul. 10, 2017
Centre National DE LA Recherche Scientifique (Cnrs), Paris, FR;
Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Sorbonne Universite, Paris, FR;
Inserm (Institut National DE LA Santé ET DE LA Recherche Medicale), Paris, FR;
Université Paris Diderot—paris 7, Paris, FR;
Ros Kiri Ing, Ivry-sur-Seine, FR;
Nathan Jeger-Madiot, Paris, FR;
Mathias Fink, Meudon, FR;
Thomas Similowski, Issy les Moulineaux, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIEN TIFIQUE (CNRS), Paris, FR;
ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS, Paris, FR;
SORBONNE UNIVERSITE, Paris, FR;
INSERM (INSTITUT NATIONAL DE LA SANTÉ ET DE LA RECHERCHE MEDICALE), Paris, FR;
UNIVERSITÉ PARIS DIDEROT—PARIS 7, Paris, FR;
Abstract
A method for detecting movements of a plurality of points (P) of a surface (), comprising a measuring step during which an incident ultrasonic wave is emitted into the air towards the surface and an ultrasonic wave reflected into the air by the surface () is detected. During the measuring step, each measuring point is illuminated by the incident ultrasonic wave at a multiplicity of angles of incidence, and the reflected ultrasonic wave is detected by a network of receiving transducers () comprising a plurality of ultrasonic receiving transducers (). The movements of the surface are determined at a measuring point by determining a delay and/or a phase shift between two beam-forming signals for said measuring point.