The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Oct. 11, 2018
Applicant:

Furuno Electric Co., Ltd., Hyogo, JP;

Inventors:

Satoshi Kawanami, Hyogo, JP;

Atsushi Uodome, Hyogo, JP;

Kensuke Iseri, Hyogo, JP;

Ryosuke Morigaki, Hyogo, JP;

Yuya Yakiyama, Hyogo, JP;

Assignee:

FURUNO ELECTRIC CO., LTD., Nishinomiya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/95 (2006.01); G01C 13/00 (2006.01); G01S 7/295 (2006.01); G01S 7/41 (2006.01);
U.S. Cl.
CPC ...
G01S 13/956 (2013.01); G01C 13/00 (2013.01); G01S 7/295 (2013.01); G01S 7/41 (2013.01); G01S 13/95 (2013.01); Y02A 90/10 (2018.01);
Abstract

The purpose is to calculate wave information accurately. A signal processing deviceis provided, which may include a frequency area spectrum generating module, an integrating module, and a wave information calculating module. The frequency area spectrum generating modulemay carry out a frequency analysis of the echoes from the waves included in a plurality of analysis areas set within the detection area, respectively, and generate frequency area spectrums for the plurality of analysis areas, respectively. The integrating modulemay integrate echo intensities indicated by each sampling point that constitutes each of the frequency area spectrums while unifying directions included in coordinates of the frequency area spectrum, and generate an integrated frequency area spectrum. The wave information calculating modulemay calculate wave information that is information related to the waves included in the analysis areas based on the integrated frequency area spectrum, respectively.


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