The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
May. 31, 2017
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Seiji Takemoto, Kobe, JP;
Takeshi Komoto, Kobe, JP;
Hideki Hirayama, Kobe, JP;
Takashi Yoshida, Kobe, JP;
James Ausdenmoore, Elgin, IL (US);
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/00722 (2013.01); G01N 2035/00653 (2013.01); G01N 2035/00891 (2013.01);
Abstract
A specimen analyzer includes: an analysis unit which analyzes a specimen collected from a subject and generates an analysis result including a component amount in the specimen; an output unit which outputs the analysis result; and a controller which causes the output unit to output or not to output the component amount based on a comparison between the component amount and a determination reference value.