The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Jul. 16, 2020
Applicants:

Shenyang University of Technology, Liaoning, CN;

Shenyang Daxingcheng Energy Technology Co., Ltd, Liaoning, CN;

Inventor:

Bo Zhou, Liaoning, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); F03D 80/50 (2016.01); G01B 9/02 (2022.01); G01B 11/06 (2006.01); G01B 11/22 (2006.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); F03D 80/50 (2016.05); G01B 9/02 (2013.01); G01B 11/06 (2013.01); G01B 11/22 (2013.01); G06T 2207/10048 (2013.01);
Abstract

The invention relates to the technical field of operation and maintenance of wind turbines, and is also applicable to non-destructive measurement of a depth of a defect of other resin-based composite materials. It is aimed at the problem that the depth of the defect cannot be determined by an intuitive infrared thermal image in the measurement of a depth of a defect of a large wind turbine blade. This method not only ensures accuracy of the measurement, but can also be widely applied. The method comprises the following steps: S1: continuously heating a surface of a wind turbine blade with an irradiation heat source; S2: collecting and storing a real-time heat map sequence of a surface of the blade with an NEC R300 infrared thermal imaging camera; S3: extracting a surface temperature rise curve at a defect location and organizing the results into a temperature rise curve family of the layers in a depth direction at the defect location; S4: extracting a surface temperature rise curve at a non-defect location, and calculating the similarity between the two temperature rise curve families; S5-S7: obtaining a reference depth value of the defect; and S8: determining whether the depth value is in a characteristic interval.


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