The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
May. 24, 2017
Sms Group Gmbh, Düsseldorf, DE;
Mostafa Biglari, Mettmann, DE;
Ulrich Sommers, Düsseldorf, DE;
Christian Klinkenberg, Herdecke, DE;
Michel Renard, Liege, BE;
Guy Raymond, Ivoz-Ramet, BE;
Oliver Pensis, Montegnee, BE;
Tobias Terlau, Wülfrath, DE;
Horst Krauthäuser, Heiligenhau, DE;
SMS GROUP GMBH, Düsseldorf, DE;
Abstract
A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.