The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Jun. 29, 2020
Applicant:
Canon Medical Systems Corporation, Otawara, JP;
Inventors:
Xiaohui Zhan, Vernon Hills, IL (US);
Xiaofeng Niu, Vernon Hills, IL (US);
Assignee:
CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/582 (2013.01); G01N 23/083 (2013.01); G01N 2223/04 (2013.01); G01N 2223/20 (2013.01); G01N 2223/303 (2013.01); G01N 2223/419 (2013.01); G01N 2223/50 (2013.01);
Abstract
A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.