The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Oct. 25, 2018
Applicant:

Heinrich Georg Gmbh Maschinenfabrik, Kreuztal, DE;

Inventors:

Arian Zeppenfeld, Olpe, DE;

Günter Klappert, Kreuztal, DE;

Jost Friedrich, Hilchenbach, DE;

Volker Loth, Freudenberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); B07C 1/14 (2006.01); G06T 7/00 (2017.01); G06T 7/55 (2017.01); H01F 41/02 (2006.01); B07C 5/10 (2006.01); G01B 11/24 (2006.01); B07C 5/04 (2006.01); G01B 11/04 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G01N 21/8914 (2013.01); B07C 1/14 (2013.01); B07C 5/04 (2013.01); B07C 5/10 (2013.01); G01B 11/04 (2013.01); G01B 11/24 (2013.01); G01B 11/2433 (2013.01); G01N 21/8901 (2013.01); G06T 7/0004 (2013.01); G06T 7/0006 (2013.01); G06T 7/55 (2017.01); G06T 7/60 (2013.01); H01F 41/0233 (2013.01); G01B 2210/52 (2013.01); G06T 2207/20221 (2013.01);
Abstract

The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (), wherein the inspection system comprises a detection unit (), a conveyance device () and a processing device, wherein the detection unit includes an optical detecting device (), wherein the conveyance device is used to continuously transport a plurality of transformer laminations () relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device () of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device.


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