The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

May. 24, 2017
Applicant:

Sikora Ag, Bremen, DE;

Inventor:

Klaus Bremer, Grasberg, DE;

Assignee:

SIKORA AG, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/85 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 21/85 (2013.01); G01N 21/8806 (2013.01); G01N 2021/8592 (2013.01); G01N 2021/8812 (2013.01);
Abstract

A device and method for reliably and accurately detecting impurities in a bulk material comprising two opposing tunnel sections arranged such that a bulk material stream flows between or through the tunnel sections. At least one of the tunnel sections has a lighting means configured for indirectly illuminating the bulk material stream. Furthermore, an optical detector receives the light emitted from the illuminated bulk material. The lighting means and optical detector are configured about the tunnel sections such that the optical radiation optical radiation does not pass directly from the lighting means to the bulk material, nor from the bulk material stream to the optical detector An evaluation apparatus, responsive to measured data from the optical detector, identifies impurities in the bulk material. The invention moreover relates to a method for operating such a device.


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