The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Feb. 28, 2017
Fukuda Co., Ltd., Tokyo, JP;
Mao Hirata, Tokyo, JP;
Tsutomu Hara, Tokyo, JP;
Naoto Izumo, Tokyo, JP;
Masaharu Sugihara, Tokyo, JP;
Fukuda Co., Ltd., Tokyo, JP;
Abstract
A method for leak testing includes a leak testing step and a reference leak step. In the leak testing step, a hollow workas a test object is encapsulated in a work capsule. A test pressure is supplied to the work capsulethrough a pathconnected to the work capsule. A variation of pressure inside the work capsuleis detected in a condition in which the pathis shut-off, and a judgment is made whether a leakage through the work is generated based on the detected output. In the reference leak step, a reference leak devicehaving a known pinholeis mounted on a work' for reference leakage that is same as the workas the test object. The work′ for reference leakage is encapsulated in the work capsule. The test pressure is supplied to the work capsulevia the path, and a reference leakage is generated in the work′ for reference leakage via the reference leak devicein a condition in which the pathis shut-off. A variation of pressure inside the work capsuleaccompanying the reference leakage is detected.