The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Jun. 12, 2018
Applicant:
New Degree Technology, Llc, Baltimore, MD (US);
Inventors:
Hao Li, Chandler, AZ (US);
Zhiyun Chen, Olney, MD (US);
Assignee:
New Degree Technology, LLC, Baltimore, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/18 (2006.01); G01K 7/16 (2006.01); G06F 3/041 (2006.01); G01B 7/16 (2006.01); H01B 1/20 (2006.01);
U.S. Cl.
CPC ...
G01K 7/16 (2013.01); G01B 7/18 (2013.01); G01L 1/18 (2013.01); G06F 3/0416 (2013.01); G06F 3/04144 (2019.05); H01B 1/20 (2013.01); G06F 3/0414 (2013.01);
Abstract
By combining at least two strain sensors in a symmetric configuration, a dual use sensor may be realized. This may reduce the footprint, cost, and complexity of employing two different sensors. It may also improve the accuracy of the measurements as two different parameters i.e., strain and environmental information are measured at the same physical location. This dual use sensor may be deployed in an array over a large area or space, providing systemic information of the subject that is previously difficult to detect.