The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
Mar. 26, 2018
Rutgers, the State University of New Jersey, New Brunswick, NJ (US);
Alexei Ermakov, Piscataway, NJ (US);
Xiuyan Li, New Brunswick, NJ (US);
Eric Garfunkel, East Brunswick, NJ (US);
Leonard C. Feldman, New Brunswick, NJ (US);
Torgny Gustafsson, Narberth, PA (US);
RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY, New Brunswick, NJ (US);
Abstract
Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.