The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Sep. 30, 2015
Applicant:

Sekisui Chemical Co., Ltd., Osaka, JP;

Inventors:

Kazuhiko Nakayama, Shiga, JP;

Yuusuke Oota, Shiga, JP;

Hirofumi Kitano, Shiga, JP;

Hiroaki Inui, Roermond, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 17/10 (2006.01); B32B 3/30 (2006.01); B32B 7/02 (2019.01);
U.S. Cl.
CPC ...
B32B 17/10036 (2013.01); B32B 3/30 (2013.01); B32B 7/02 (2013.01); B32B 17/10587 (2013.01); B32B 17/10761 (2013.01); B32B 2307/538 (2013.01);
Abstract

The present invention aims to provide an interlayer film for a laminated glass which can be stored in a stacked state without experiencing autohesion so as to be easily peelable, and a laminated glass including the interlayer film for a laminated glass. The present invention relates to an interlayer film for a laminated glass, having a large number of recesses and a large number of projections on a first surface and a second surface opposite to the first surface, the recesses on the first surface and the second surface each having a groove shape with a continuous bottom and being regularly adjacent and parallel to each other, the interlayer film for a laminated glass satisfying Formulae (1) and (2):θ≥10°  (1),≤0.3  (2),the θ representing an intersection angle of the recesses each having a groove shape with a continuous bottom on the first surface and the recesses each having a groove shape with a continuous bottom on the second surface, the Sm representing the average of Sm1 (μm) and Sm2 (μm), the Sm1 representing an interval between the recesses each having a groove shape with a continuous bottom on the first surface, the Sm2 representing an interval between the recesses each having a groove shape with a continuous bottom on the second surface, the R representing the average of R1 (μm) and R2 (μm), the R1 representing the radius of rotation of the projections on the first surface, the R2 representing the radius of rotation of the projections on the second surface.


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