The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Aug. 24, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Shinji Ohishi, Oyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G16H 50/20 (2018.01); G16H 30/40 (2018.01); G16H 40/63 (2018.01); G16H 30/20 (2018.01);
U.S. Cl.
CPC ...
A61B 5/0095 (2013.01); A61B 5/742 (2013.01); G16H 30/40 (2018.01); G16H 40/63 (2018.01); G16H 50/20 (2018.01); A61B 5/7495 (2013.01); A61B 2560/0266 (2013.01); G16H 30/20 (2018.01);
Abstract

The present invention provides an apparatus which efficiently perform an examination based on an examination order. The apparatus includes a connection unit configured to be connected to a plurality of measurement units each of which includes a light irradiation unit which irradiates a subject with light and a reception unit which receives an acoustic wave generated from the subject irradiated with the light, a first obtaining unit configured to obtain information on an examination order; a second obtaining unit configured to obtain information on a selected one of the measurement units connected to the connection unit, and a determination unit configured to determine whether the selected measurement unit is suitable for the examination order in accordance with the information on the examination order and the information on the selected measurement unit.


Find Patent Forward Citations

Ohishi, Shinji. (2022). Apparatus performing examination utilizing photoacoustic effect, examination support method, and program (U.S. Patent No. 11246492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11246492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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