The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Aug. 20, 2018
Applicant:

Amo Wavefront Sciences, Llc, Santa Ana, CA (US);

Inventor:

Richard J. Copland, Albuquerque, NM (US);

Assignee:

AMO Development, LLC, Santa Ana, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/107 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/145 (2013.01); A61B 3/0025 (2013.01); A61B 3/107 (2013.01); A61B 3/1015 (2013.01);
Abstract

An eye measurement instrument includes: an optical measurement subsystem for measuring an optical characteristic of an eye; an imaging system, including: a camera, an optical system including a movable optical element, and an actuator to move the movable optical element. When the movable optical element is moved into a first position outside an optical path between the eye and the camera, then the optical system focuses a first feature of the eye at the camera, and the camera is configured to capture a first image of the eye, and when the movable element is moved in a second position in the optical path then the optical system focuses a second feature of the eye, different from the first feature, at the camera, and the camera captures a second image of the eye.


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