The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2022
Filed:
May. 29, 2019
University of Rochester, Rochester, NY (US);
James M. Zavislan, Rochester, NY (US);
Aizhong Zhang, Rochester, NY (US);
University of Rochester, Rochester, NY (US);
Abstract
The present disclosure provides systems and methods for characterizing thin films, such as, for example, diagnosis of dry eye syndrome, thin-film optical metrology testing, etc. The present disclosure may be embodied as a tearscope, which is sometimes referred to herein as a Macroscopic Imaging Ellipsometer (MIE) because it may be considered to be an imaging ellipsometer with, for example, a field-of-view on the order of tens of millimeters or more (i.e., macroscopic), compared with conventional imaging ellipsometers, which usually employ microscope objectives and have fields-of-view of up to several hundred microns.