The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Jan. 18, 2019
Omron Corporation, Kyoto, JP;
Yutaka Kato, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
To provide an appearance inspection system capable of reduce labor for setting an imaging condition by a designer when a plurality of inspection target positions on a target is sequentially imaged. An appearance inspection system includes an imaging condition decision part and a route decision part. The imaging condition decision part decides a plurality of imaging condition candidates including a relative position between a workpiece and an imaging device for at least one inspection target position among a plurality of inspection target positions. The route decision part decides a change route of an imaging condition for sequentially imaging the plurality of inspection target positions by selecting one imaging condition among the plurality of imaging condition candidates so that a pre-decided requirement is satisfied.