The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Apr. 25, 2016
Vmware, Inc., Palo Alto, CA (US);
Christopher Knowles, London, CA;
Jeffery Crukley, Milton, CA;
VMware, Inc., Palo Alto, CA (US);
Abstract
The current document is directed to methods and systems for frequency-domain analysis of operational and performance metric values and other data generated and collected within computer systems, including large distributed computer systems and virtualized data centers. In one implementation, each set of time-ordered values for each metric in a set of metrics is partitioned into time intervals, transformed from the time domain to the frequency domain, and aligned to generate a metric surface in a frequency-time-amplitude space. The metric surfaces are then pairwise compared to identify related metrics. Transfer functions are generated for transforming metric surfaces into one another. The comparison values and transfer functions are used to produce graphs that encapsulate discovered relationships between metrics.