The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Dec. 19, 2017
Applicant:

Imec Vzw, Leuven, BE;

Inventors:

Nicolaas Tack, Leuven, BE;

Bert Geelen, Leuven, BE;

Bart Vereecke, Leuven, BE;

Assignee:

IMEC VZW, Leuven, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/26 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14623 (2013.01); G01J 1/4228 (2013.01); G01J 3/0229 (2013.01); G01J 3/26 (2013.01); G01J 3/2803 (2013.01); H01L 27/1464 (2013.01); H01L 27/14607 (2013.01); H01L 27/14621 (2013.01); H01L 27/14643 (2013.01);
Abstract

An imaging sensor comprises: an array of light-detecting elements, wherein each light-detecting element in the array of light-detecting elements is arranged in the imaging sensor so as to detect a respective wavelength interval, wherein the respective wavelength interval differs for different light-detecting elements; a pattern arranged on the array of light-detecting elements, wherein the pattern defines a plurality of transparent areas, each transparent area being associated with a corresponding light-detecting element in the array of light-detecting elements, wherein a size of a transparent area among the plurality of transparent areas is dependent of the corresponding light-detecting element with which the transparent area is associated.


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