The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

May. 31, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Tomoyuki Oshiro, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/40 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0027 (2013.01); H01J 49/0009 (2013.01); H01J 49/0036 (2013.01); H01J 49/022 (2013.01); H01J 49/40 (2013.01); H01J 49/401 (2013.01); H01J 49/405 (2013.01); H01J 49/429 (2013.01);
Abstract

An analytical device includes: a mass spectrometry unit that separates ions based on flight time and detects the ions having been separated; an analysis unit that creates data corresponding to a spectrum in which an intensity of the ions having been detected and the flight time or m/z corresponding to the flight time are associated; a peak width calculation unit that calculates a first peak width at a first intensity and a second peak width at a second intensity different from the first intensity for at least one peak in the spectrum; and an adjustment unit that performs an adjustment of the mass spectrometry unit based on the first peak width and the second peak width.


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