The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Sep. 16, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kazuaki Tokunaga, Tokyo, JP;

Syunsuke Monai, Hitachi, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06F 16/00 (2019.01); G06F 16/245 (2019.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/045 (2013.01); G06F 16/00 (2019.01); G06F 16/245 (2019.01); G06N 5/025 (2013.01);
Abstract

A data analysis device that analyzes data having a record including an objective variable and a plurality of explanatory variables includes a node generating unit that generates a node specified by a condition of the explanatory variable on the basis of the objective variable and the explanatory variable of the record and associating the record with the node, an evaluation value generating unit that generates a proportion of the number of records whose target value is the objective variable among a plurality of records associated with the node as an evaluation value, and a parameter extracting unit that selects a node on the basis of the evaluation value and extracts and outputs the condition of the explanatory variable related to the selected node.


Find Patent Forward Citations

Loading…