The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Mar. 20, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rajesh Bordawekar, Westchester, NY (US);

Tin Kam Ho, Miburn, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06K 9/62 (2006.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06K 9/627 (2013.01); G06N 5/047 (2013.01); G06N 20/00 (2019.01);
Abstract

A first observation window in a first time series is identified. The first observation window is preceded by a first portion of the first time series. A neural network is trained using the first portion of the first time series and the first observation window, and weights are extracted from the middle layers of the neural network. A first feature vector is generated based on the weights. A second observation window in a second time series is identified, where the second observation window is preceded by a first portion of the second time series. A second feature vector associated with the second observation window is determined. The second feature vector is based at least in part on the first set of weights. A similarity between the first and second observation windows is determined based on comparing the first feature vector and the second feature vector.


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