The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Jul. 30, 2021
Applicant:

Institute of Automation, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Jianhua Tao, Beijing, CN;

Licai Sun, Beijing, CN;

Bin Liu, Beijing, CN;

Zheng Lian, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/35 (2020.01); G10L 15/08 (2006.01); G10L 15/02 (2006.01); G10L 15/24 (2013.01); G06N 3/04 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 40/35 (2020.01); G06K 9/00718 (2013.01); G06K 9/00744 (2013.01); G06K 9/629 (2013.01); G06K 9/6217 (2013.01); G06N 3/04 (2013.01); G10L 15/02 (2013.01); G10L 15/083 (2013.01); G10L 15/24 (2013.01);
Abstract

A multi-modal lie detection method and apparatus, and a device to improve an accuracy of an automatic lie detection are provided. The multi-modal lie detection method includes inputting original data of three modalities, namely a to-be-detected audio, a to-be-detected video and a to-be-detected text; performing a feature extraction on input contents to obtain deep features of the three modalities; explicitly depicting first-order, second-order and third-order interactive relationships of the deep features of the three modalities to obtain an integrated multi-modal feature of each word; performing a context modeling on the integrated multi-modal feature of the each word to obtain a final feature of the each word; and pooling the final feature of the each word to obtain global features, and then obtaining a lie classification result by a fully-connected layer.


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