The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Aug. 18, 2019
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Hideji Naohara, Kyoto, JP;

Tomonori Fujiwara, Kyoto, JP;

Yumiko Hirato, Kyoto, JP;

Atsushi Sonoda, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/32 (2006.01); G06F 3/0482 (2013.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 11/324 (2013.01); G06F 3/0482 (2013.01); G06K 9/6277 (2013.01);
Abstract

A data processing method includes a step of obtaining scores of time-series data by comparing the time-series data with reference data in order to process time-series data acquired in a substrate processing apparatus having one or more processing units, a step of classifying the scores into a plurality of levels, and a step of displaying an evaluation result screen including a graph showing an occurrence rate of each level of the scores, the number of occurrences of each level, and a graph showing temporal change in the number of occurrences of a worst level of the scores when substrates have been processed through a predetermined method with respect to the processing units. Accordingly, a data processing method through which a state of the substrate processing apparatus can be easily ascertained is provided.


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