The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Jun. 26, 2020
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Jagaran Das, West Bengal, IN;

Srinivas Yelisetty, Fremont, CA (US);

Teresa Sheausan Tung, Tustin, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 9/54 (2006.01); G06F 9/38 (2018.01); G06F 9/50 (2006.01); G06F 13/40 (2006.01); G06F 13/38 (2006.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 3/0644 (2013.01); G06F 3/0604 (2013.01); G06F 3/067 (2013.01); G06F 9/3869 (2013.01); G06F 9/5072 (2013.01); G06F 9/547 (2013.01); G06F 13/382 (2013.01); G06F 13/4068 (2013.01); G06F 16/24568 (2019.01);
Abstract

A data pipeline architecture is integrated with an analytics processing stack. The data pipeline architecture may receive incoming data streams from multiple diverse endpoint systems. The data pipeline architecture may include converter interface circuitry with multiple dynamic converters configured to convert the diverse incoming data stream into one or more interchange formats for processing by the analytics processing stack. The analytics processing stack may include multiple layers with insight processing layer circuitry above analysis layer circuitry. The analysis layer circuitry may control analytics models and rule application. The insight processing layer circuitry may monitor output from the analysis layer circuitry and generate insight adjustments responsive to rule changes and analytics model parameter changes produced at the analysis layer circuitry.


Find Patent Forward Citations

Loading…