The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Dec. 17, 2019
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Florian Lang, Gilching, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0484 (2013.01); G06F 3/0488 (2013.01); G06F 3/0482 (2013.01);
U.S. Cl.
CPC ...
G06F 3/04883 (2013.01); G06F 3/0482 (2013.01); G06F 3/04847 (2013.01); G06F 2203/04808 (2013.01);
Abstract

The present invention relates to an enhanced control of a measurement device displaying a signal waveform of a measurement signal. For this purpose, the waveform of the measurement signal is displayed on a touch-screen. The touch-screen receives multi-digit touch gestures comprising at least two touch gestures. The touch gestures of the multi-digit touch gesture are analyzed in order to determine simultaneously an operation and a range of the measurement signal on which the determined operation has to be applied. In this way, the control of the measurement device can be simplified.


Find Patent Forward Citations

Lang, Florian. (2022). Measurement apparatus and method for analyzing a measurement signal (U.S. Patent No. 11243684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11243684

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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