The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
May. 30, 2017
Southern Innovation International Pty Ltd, Carlton North, AU;
Paul Scoullar, Fitzroy North, AU;
Christopher McLean, Kangaroo flat, AU;
Shane Tonissen, Kensington, AU;
Syed Khusro Saleem, Fitzroy North, AU;
Southern Innovation International Pty Ltd, Carlton North, AU;
Abstract
The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays () configured to irradiate at least part of the material; one or more detectors () adapted to detect radiation emanating from within or passing through the material as a result of the irradiation by the incident radiation () and thereby produce a detection signal (); and one or more digital processors (--) configured to process the detection signal () to characterise at least part of the material; wherein the one or more detectors () and one or more digital processors (--) are configured to characterise at least part of the material by performing energy resolved photon counting X-ray transmission spectroscopy analysis.