The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Apr. 28, 2021
Applicant:

Xi'an Jiaotong University, Shaanxi, CN;

Inventors:

Jinghuai Gao, Shaanxi, CN;

Yajun Tian, Shaanxi, CN;

Daoyu Chen, Shaanxi, CN;

Naihao Liu, Shaanxi, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/36 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 1/36 (2013.01); G06N 3/08 (2013.01); G01V 2210/50 (2013.01); G01V 2210/63 (2013.01);
Abstract

Disclosed herein is a method of stripping a strong reflection layer based on deep learning. The method establishes a direct mapping relationship between a strong reflection signal and seismic data of a target work area through a nonlinear mapping function of the deep neural network, and strips a strong reflection layer after the strong layer is accurately predicted. A mapping relationship between the seismic data containing the strong reflection layer and an event of the strong reflection layer is directedly found through training parameters. In addition, this method does not require an empirical parameter adjustment, and only needs to prepare a training sample that meets the actual conditions of the target work area according to the described rules.


Find Patent Forward Citations

Gao, Jinghuai. (2022). Method of stripping strong reflection layer based on deep learning (U.S. Patent No. 11243320). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11243320

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…