The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Jan. 23, 2019
Applicant:
Conocophillips Company, Houston, TX (US);
Inventors:
Peter M. Eick, San Antonio, TX (US);
Joel D. Brewer, Sealy, TX (US);
Assignee:
ConocoPhillips Company, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/32 (2006.01); G01V 1/00 (2006.01); G01V 1/38 (2006.01);
U.S. Cl.
CPC ...
G01V 1/28 (2013.01); G01V 1/003 (2013.01); G01V 1/32 (2013.01); G01V 1/3808 (2013.01); G01V 2200/14 (2013.01); G01V 2210/44 (2013.01);
Abstract
Methods of analyzing and optimizing a seismic survey design are described. Specifically, the sampling quality is analyzed as opposed to the overall quality of the whole survey. This allows for analysis of the impact of the offsets, obstacles, and other aspects of the survey on the sampling quality, which will improve the ability to compress the resulting data and minimize acquisition footprints.