The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Nov. 23, 2020
Applicant:
Hellma Materials Gmbh, Jena, DE;
Inventor:
Sibylle Petrak, Hena, DE;
Assignee:
Hellma Materials GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/167 (2006.01); G01T 1/164 (2006.01); A61B 6/03 (2006.01); G01T 1/29 (2006.01); G06T 11/00 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/167 (2013.01); A61B 6/037 (2013.01); G01T 1/1642 (2013.01); G01T 1/1644 (2013.01); G01T 1/2985 (2013.01); G06T 11/006 (2013.01); G01T 7/00 (2013.01); G06T 2211/421 (2013.01);
Abstract
A device for generating one or more images of a source distribution of a gamma radiation field in the near and far field can include a detector system that includes several synchronized detectors for detecting radiation, system electronics that registers coincidence events, a data acquisition system that stores the measurement data of the coincidence events, and an analysis unit that performs an image reconstruction, which reconstructs one or more images of the source distribution of the radiation field.
Petrak, Sibylle. (2022). Imaging detector system for gamma radiation using unidirectional and bidirectional compton scattering processes (U.S. Patent No. 11243312). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11243312
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile