The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Jul. 26, 2018
Technische Universitaet Wien, Vienna, AT;
Bernhard Lendl, Vienna, AT;
Jakob Hayden, Vienna, AT;
Bettina Baumgartner, Vienna, AT;
Christian Kristament, Sigmundsherberg, AT;
TECHNISCHE UNIVERSITAET WIEN, Vienna, AT;
Abstract
A method and an interferometric device for spectroscopically or spectrometrically examining a sample, comprising: a) generating a laser beam having a wavelength, b) splitting the laser beam into a measurement beam and a reference beam, c) interacting the sample with the measurement beam, d) interacting a reference with the reference beam, e) overlaying the measurement beam and the reference beam, f) detecting a first output beam, g) detecting a second output beam, h) forming a differential signal between the first output signal and the second output signal, i) controlling the differential signal to a predefined target value, j) determining a refractive index of the sample from the adjustment of the phase difference between the measurement beam and the reference beam, k) repeating steps a) to j) for additional wavelengths of the laser beam.