The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Mar. 29, 2018
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Christoph Sander, Dresden, DE;
Martin Gall, Dresden, DE;
Frank Macher, Dresden, DE;
Andre Clausner, Dresden, DE;
Ehrenfried Zschech, Moritzburg, DE;
Abstract
The invention relates to a device for carrying out bending tests on panel-shaped or beam-shaped samples (), in which two rotary drives are arranged at a distance from one another and a flange () is fastened to each of the drive shafts of the rotary drives, said drive shafts being oriented parallel to one another. At least two bar-shaped bending elements () oriented parallel to the axis of rotation of the drive shafts and arranged at a distance from the axis of rotation and at a distance from one another are provided on each of the flanges (). A panel-shaped or beam-shaped sample () can be introduced between the two bar-shaped bending elements () on the two flanges (). In the event of rotation of the rotary drives in opposite directions of rotation, bending forces are exerted on the sample () and each of the two rotary drives can be controlled individually and connected to an electronic open-loop or closed-loop control unit.