The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Mar. 19, 2019
Applicant:
Hifi Engineering Inc., Calgary, CA;
Inventors:
John Hull, Calgary, CA;
Seyed Ehsan Jalilian, Calgary, CA;
Assignee:
Hifi Engineering Inc., Calgary, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 11/32 (2021.01); G01K 1/20 (2006.01); G01B 11/16 (2006.01); G01H 9/00 (2006.01); G01N 25/16 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01K 11/32 (2013.01); G01B 11/161 (2013.01); G01H 9/004 (2013.01); G01K 1/20 (2013.01); G01N 25/16 (2013.01); G01N 21/45 (2013.01);
Abstract
Described are methods and systems using optical fiber interferometry to sense interference causing events in a region of interest and differentiate between a strain event and a thermal event. Other methods and systems relate to the use of optical fiber interferometry for determining temperature offset in a region of interest and using the determined temperature offset for determining temperature in the region of interest.