The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Dec. 19, 2018
Applicant:

Tomey Corporation, Nagoya, JP;

Inventor:

Masahiro Yamanari, Nagoya, JP;

Assignee:

TOMEY CORPORATION, Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02071 (2013.01); G01B 9/02004 (2013.01); G01B 9/02067 (2013.01); G01B 9/02069 (2013.01); G01B 9/02072 (2013.04); G01B 9/02091 (2013.01);
Abstract

An optical coherence tomographic device may include a light source, a measurement light generator, a reference light generator, an interference light generator, an interference light detector, and a processor. The interference light detector may include a first and second detector that convert interference light to interference signals, a first signal processing unit that samples the interference signal from the first detector, and a second signal processing unit that samples the interference signal from the second detector. Each of the first and second signal processing units may sample the interference signal at a timing from outside. Light generated by the measurement light generator may at least include first and second correction light. The processor may correct a time lag between sampling timings of the first and second signal processing units by using a first and second correction signal converted from the first and second correction light.


Find Patent Forward Citations

Loading…