The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Apr. 21, 2020
Seiko Epson Corporation, Tokyo, JP;
Manabu Watanabe, Shiojiri, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A quality determination method for a three-dimensional shaped object includes: a shaping step of shaping a plurality of three-dimensional shaped objects by discharging a liquid from a nozzle hole toward a stage while changing a relative position between a discharge unit having a plurality of the nozzle holes arranged along a first direction and the stage in a second direction intersecting the first direction; a discharge inspection step of inspecting a discharge state of the liquid from the nozzle hole after or during the shaping step; and a quality determination step of determining that, when an abnormality is detected in the discharge state from at least one nozzle hole of the plurality of nozzle holes in the discharge inspection step, a low-quality three-dimensional shaped object is included in the plurality of shaped three-dimensional shaped objects.