The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2022
Filed:
Sep. 18, 2019
Deere & Company, Moline, IL (US);
Sebastian Blank, Moline, IL (US);
DEERE & COMPANY, Moline, IL (US);
Abstract
Systems and methods for geospatial yield mapping by managing and modeling a system-based delay between crop location and crop sensing. The system stores a plurality of yield rate values indicative of crop yield detected by a sensor and a plurality of geospatial location values as time sequence data sets. The system then maps a yield rate value to a geospatial location value by determining an offset indicative of a total delay time from when the crop is cut from the field to when the crop is detected by the yield sensor. In some implementations, the delay value is determined as an integer multiple of a defined sampling frequency and is determined as a sum of a plurality of delay component values each indicative of a portion of the total delay time associated with a different one of a plurality of component systems of the crop harvester.