The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

May. 11, 2018
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jie Cui, Santa Clara, CA (US);

Yang Tang, San Jose, CA (US);

Rui Huang, Beijing, CN;

Yuan Zhu, Beijing, CN;

Shuang Tian, Santa Clara, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/204 (2006.01); H04W 24/10 (2009.01); H04L 27/26 (2006.01); H04W 28/06 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 27/2613 (2013.01); H04W 28/06 (2013.01); H04W 36/0088 (2013.01);
Abstract

An invention to perform a method of cell measurement in a wireless network, wherein the wireless network comprises a plurality of frequency layers, the invention configured to: determine a Measurement Gap Length, MGL, for each one of the plurality of frequency layers operational in the wireless network; determine a gap bitmap to indicate a measurement gap availability in a time sequence for each one of the plurality of frequency layers of the wireless network; and transmit gap assistance information for each one of the plurality of frequency layers of the wireless network to a User Equipment, wherein the gap assistance information comprises at least the determined Measurement Gap Length and the determined gap bitmap.


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