The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Dec. 21, 2020
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Eliud Robles Flores, Rochester, NY (US);

Paul Roberts Conlon, South Bristol, NY (US);

David C. Craig, Pittsford, NY (US);

Lee C. Moore, Penfield, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/19 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00344 (2013.01); H04N 1/00029 (2013.01); H04N 1/00037 (2013.01); H04N 1/1906 (2013.01);
Abstract

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.


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