The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Aug. 20, 2019
Applicant:
Agilent Technologies, Inc., Santa Clara, CA (US);
Inventors:
Naoki Sugiyama, Tokyo, JP;
Amir Liba, Wilmington, DE (US);
Mark Lee Kelinske, Waco, TX (US);
Glenn David Woods, Glossop, GB;
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/00 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4215 (2013.01); H01J 49/0027 (2013.01); H01J 49/105 (2013.01);
Abstract
Systems and methods for controlling mass filtering of polyatomic ions in an ion beam passing through an inductively coupled plasma mass spectrometer (ICP-MS). Polyatomic ion mass data representative of the exact mass of a polyatomic ion having a target isotope is determined. A control signal is generated based on the determined polyatomic ion mass data and output to an ICP-MS to filter based on mass the polyatomic ions in the ion beam traveling through the ICP-MS to an ion detector.