The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
May. 15, 2020
Applicant:
SK Hynix Inc., Icheon, KR;
Inventors:
Myung Jin Jo, Joyang, KR;
Dae Sung Kim, Icheon, KR;
Assignee:
SK hynix Inc., Icheon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/50 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 29/12005 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01);
Abstract
A memory system performs Error Correcting Code (ECC) decoding on data read from a plurality of target memory cells of a memory device, determines whether to update a read bias used in read operations of the memory device according to results of the ECC decoding, and then may update a value of the read bias based on result data produced by the ECC decoding and the number of data bits corrected by the ECC decoding, thereby optimizing the read bias value according to a change in a threshold voltage distribution of the memory cell, and increasing the likelihood of success of the ECC decoding.