The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Apr. 17, 2018
Hitachi, Ltd., Tokyo, JP;
Jumpei Honda, Tokyo, JP;
Takuma Nishimura, Tokyo, JP;
Hiroshige Kashiwabara, Tokyo, JP;
Hidemasa Nakai, Tokyo, JP;
Yuichi Igarashi, Tokyo, JP;
Ryo Nakano, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An inspection target reading device includes a wireless slave station that performs communication via a wireless network, a measurement unit that measures a state of an inspection target, and an analysis unit that generates measurement data, and transmits the measurement data from the wireless slave station via the wireless network. An automatic inspection system includes a wireless master station that communicates with each inspection target reading device via the wireless network, a data acquisition unit that acquires the measurement data from each inspection target reading device through a wireless master station, a data storage unit that stores the measurement data, a determination condition storage unit that stores determination conditions related to the measurement data, and an inspection unit that outputs predetermined measurement data selected from the stored measurement data and a predetermined determination condition corresponding to the predetermined measurement data among the stored determination conditions in association with each other.