The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Aug. 31, 2020
Applicant:
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Inventors:
Skyler Jonathon Saleh, San Diego, CA (US);
Sagar S. Bhandare, San Diego, CA (US);
Fataneh F. Ghodrat, Boxborough, MA (US);
Paul Raymond Vella, Boxborough, MA (US);
Assignee:
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 15/40 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 15/40 (2013.01); G06T 2210/21 (2013.01);
Abstract
A technique for performing ray tracing operations is provided. The technique includes reading descendant-shared type metadata for a non-leaf node of a bounding volume hierarchy; identifying one or more culling types for a ray-intersection test for a ray; and determining whether to treat the non-leaf node as not intersected based on whether the one or more culling types includes at least one type specified by the descendant-shared type metadata.